Mark Munch on instrument technology
From Interview with Dr Mark Munch, President of Bruker Nano Surfaces · · azonano
“We have led the way in instrument stability for large scanning; our Dimension Icon platform achieves atomic scale resolution over large scans, a first for the industry, and our Dimension Fast Scan images atomic scale over large scan links while going fast.”
On , Mark Munch, Corporate Executive Vice President and President of Bruker Nano Group & Corporate at BRUKER CORP, spoke about instrument technology during Interview with Dr Mark Munch, President of Bruker Nano Surfaces on azonano.
About Mark Munch
In a 2012 interview, Mark Munch, then President of Bruker Nano Surfaces, discussed the company's progress following its transition from Veeco to Bruker. He stated that the integration had been smooth and that Bruker's status as a scientific instrument company provided a "better fit," resulting in enhanced investment in sales, service, and facilities, as well as support for partnerships and acquisitions. Munch highlighted continued innovation, including faster image acquisition in atomic force microscopy (AFM) and a focus on ease of use through modes like peak force tapping. He emphasized the importance of providing quantitative nanoscale information beyond topography, such as nanomechanical, nanoelectrical, and chemical data. Munch also discussed the "Seen at N Scale" event, describing it as a key venue for technical exchange. He outlined plans to expand the event's geographic reach beyond the US and Europe to other regions, and to increase collaborations to leverage the event's brand.