KGD 2020 - Jeff David: Improving SiP Quality and Reducing Cost Through the Use of Machine Learning..
KGD Workshop 2020 "Improving SiP Quality and Reducing Cost Through the Use of Machine Learning and Predictive Analytics" Jeff David PDF Solutions The More-than-Moore era has ushered multi-chip “System-in-Package” (SiP) modules into wide-spread production and companies face challenges controlling the cost of these complex devices while meeting stringent customer quality requirements. Conventional test techniques based on specification limits often fall short of guaranteeing acceptable quality levels, and statistical outlier mechanisms fail to perform well due to the large number of measured te…
