Corporate Executive Vice President and President of Bruker Nano Group & Corporate, Bruker
Search every verified Mark Munch interview, podcast appearance, and on-the-record quote — each transcript cross-checked by AI and human review to confirm speaker identity. In a 2012 interview, Mark Munch, then President of Bruker Nano Surfaces, discussed the company's progress following its transition from Veeco to Bruker. He stated that the integration had been smooth and that Bruker's status as a scientific instrument company provided a "better fit," resulting in enhanced investment in sales, service, and facilities, as well as support for partnerships and acquisitions. Munch highlighted continued innovation, including faster image acquisition in atomic force microscopy (AFM) and a focus on ease of use through modes like peak force tapping. He emphasized the importance of providing quantitative nanoscale information beyond topography, such as nanomechanical, nanoelectrical, and chemical data. Munch also discussed the "Seen at N Scale" event, describing it as a key venue for technical exchange. He outlined plans to expand the event's geographic reach beyond the US and Europe to other regions, and to increase collaborations to leverage the event's brand.
“We've seen enhanced investment in our sales coverage, service coverage, and facilities around the world, including upgraded factories and tremendous support for partnerships and acquisitions, such as the recent acquisition in Campbell, California of C.”
“We've integrated into Bruker without slowing down innovation at all, continuing to put out a number of new products just as we did under VCO; that rate of innovation has just continued under Bruker.”
“Ease of use has been a long-standing challenge for the AFM industry, as AFMs are traditionally very hard to use and require specialization to get high-quality results; we've been focusing on ease of use with innovations like peak force tapping mode and scan assist across multiple product lines.”
“We have changed the game by allowing 100 times faster image acquisition in AFM, increasing speed while improving performance range, enabling imaging of softer materials without sample damage and broadening applications.”
“Going beyond topography is key; we provide quantitative nanoscale information such as nanomechanical, nanoelectrical, and chemical identification to help scientists understand the surface properties beyond just the image.”
“We lead the way in breadth of products to suit any application, offering the largest product and mode sets including electrical, topography, and mechanical modes, with a very complete set of products.”
“We have led the way in instrument stability for large scanning; our Dimension Icon platform achieves atomic scale resolution over large scans, a first for the industry, and our Dimension Fast Scan images atomic scale over large scan links while going fast.”
“What we do to help our customers really helps push the whole industry forward.”
“Seen at N Scale is a key event that facilitates technical exchange and brings industry together to exchange ideas; we plan to enhance collaborations, leverage the brand, increase the number of events, and expand geographic reach beyond the US and Europe to other regions of the world.”
Will Soutter interviews Dr Mark Munch from Bruker Nano Surfaces at the Seeing at the Nanoscale event in Bristol.
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